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Purification and coatings
Semiconductor and PV industry: high-tech constraints
Purity constraints:
- Our purity processes allow us to achieve extremely low impurity levels, to below 5 ppm.
- The ETV-ICP method is used to detect and monitor impurities to levels below 5 ppb.
Cleanliness constraints:
- Vitreous Carbon Impregnation (VCI) was developed to reduce particle emissions and the vacuum outgassing of materials, particularly for semi-conductor applications.
Resistance to reagents used in plasma processes:
- Mersen products can be coated with a thin layer of pyrolitic carbon thereby reducing the material's permeability to reactive products to a minimum, particularly for semi-conductor applications.
- In order to further enhance the resistance to process reagents, Mersen proposes core impregnation with resin to reduce porosities.
Resistance to hydrogen above 900 °C, MOCVD reagents, and strong acids (HCl, HF)
- Mersen has mastered the deposition of silicon carbide thin films which provides unequalled protection of graphite equipment in particularly harsh environments.
Contact United Kingdom
GS Teesside office
GS sales office
Boltby Way
Durham Lane Industrial Park
Eaglescliffe
TS16 0RH
Durham Lane Industrial Park
Eaglescliffe
TS16 0RH
Call us now
+44 1642 790 100
Send us a message
Contact United Kingdom
GS Teesside office
GS sales office
Boltby Way
Durham Lane Industrial Park
Eaglescliffe
TS16 0RH
Durham Lane Industrial Park
Eaglescliffe
TS16 0RH
Call us now
+44 1642 790 100
Send us a message
Product Literature
ETV-ICP OES - detecting limits for high purity carbon and graphite
Download1.82 MB
ETV-ICP OES - detecting limits for high purity carbon and graphiteETV-ICP OES - detecting limits for high purity carbon and graphite
Download1.82 MB
ETV-ICP OES - detecting limits for high purity carbon and graphite